The dielectric and crystallographic measurements of various materials using X-ray diffraction (XRD) methods, accompanied by an inductance, capacitance, resistance (LCR) meter, can be of great use for studying and modifying these materials. Performing these measurements independently has the chance to produce unexpected errors or lead to false conclusions.
In this work, the electrical infrastructure and software needed for these measurements were developed in order to obtain the XRD pattern and capacitance of materials under varying temperatures. From the capacitance data, it is possible to gain information on other properties of the material, such as its dielectric constant and polarization.
This system was tested on barium titanate (BaTiO\(_3\)), which has been extensively studied. This ceramic was chosen for its multiple structural phase transitions at different temperatures, in turn changing its dielectric constant. The results are well aligned with prior research indicating to the effectiveness of the system.
