INVESTIGATION OF OPTIMIZATION AND MANUFACTURE POTENTIAL FOR SCULPTURED THIN FILM BASED ACHROMATIC WAVEPLATES

Emanuelis Lazauskas1, Lina Grinevičiūtė1, Gabija Petrauskaitė1, Lukas Ramalis1, Tomas Tolenis1

1 Center for Physical Sciences and Technology, Lithuania

[email protected]

Sculptured thin film technology allows to produce nanostructured coatings featuring various properties, like certain porosity and anisotropy [1]. By optimizing these and other parameters, one can obtain coatings with different optical characteristics, which can be adapted for optical element realization. Furthermore, these coatings possess excellent resistivity to laser irradiation when silica material is used and can be deposited directly onto microlaser system components [2]. Therefore, this technology is a potential research area for microlaser component manufacture.

Figure 1
Fig. 1. (a) Illustration of serial bideposition technique involving rapid 180° substrate turns. (b) Cross-sectional SEM image of SiO2 sculptured thin film.

In this work, however, the scope of investigation was limited to achromatic waveplates. Thus, the main objective was to examine the optimization and manufacture potential for sculptured thin film based achromatic waveplates. The problem was approached by utilizing anisotropic properties of serially bideposited (see Fig. 1) orthogonally birefringent SiO2 multilayer structures (see Fig. 2). Due to the existence of unique Kramers-Kronig relations for transmission amplitude coefficient $\tau$ [3], different transmittance T band-gaps for S and P polarised radiation result in corresponding phase shift differences, which allow to compensate for natural dispersion (see Fig. 2). Taking full advantage of this mechanism, achromatic waveplate designs were optimized employing Dlib global optimization C++ library routines [4].

Figure 2
Fig. 2. Differential phase compensation mechanism. (a) and (b) Transmittance spectra for P and S polarised radiation. (c) Example of orthogonally birefringent periodic structure. (d) Phase difference spectrum.

The main source of error in manufactured waveplate optical and phase characteristics was determined to be caused by inaccurately chosen birefringence values and deposited layer thickness errors, which reached 7.5%. Nevertheless, the examination of a more robustly designed waveplate allows to conclude that with accurately chosen birefringence values a functioning achromatic waveplate can be successfully manufactured.


[1] K. M. M. Hawkeye, Glancing angle deposition of thin films: engineering the nanoscale (John Wiley & Sons, 2014).

[2] L. Grinevičiūtė, M. Andrulevičius, A. Melninkaitis et al., Highly Resistant Zero-Order Waveplates Based on All-Silica Multilayer Coatings, physica status solidi (a) 214, 1700764 (2017).

[3] B. Gralak, M. Lequime, M. Zerrad et al., Phase retrieval of reflection and transmission coefficients from Kramers–Kronig relations, JOSA A 32, 456–462 (2015).

[4] D. E. King, Dlib-ml: A machine learning toolkit, The Journal of Machine Learning Research 10, 456-462 (2015).